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Lightwave source characterization (electrical-in and optical-out) Source slope responsivity tests • Modulation bandwidth • Modulated output power flatness • Step response • Modulation signal group delay and differential phase • Reflected signal sensitivity • Distance-time response Optical reflection tests • Port return loss • Distance-time response Electrical reflection tests • Port impedance or return loss • Distance-time response Lightwave receiver characterization (optical-in and electrical-out) Receiver slope responsivity tests • Modulation bandwidth • Modulated output power flatness • Step response • Modulation signal group delay and differential phase • Distance-time response Optical reflection tests • Port return loss • Distance-time response Electrical reflection tests • Port impedance or return loss • Distance-time response Optical device characterization (optical-in and optical-out) Optical transfer function tests • Insertion loss or gain • Modulated output power flatness • Step response . • Modulation signal group delay and differential phase • Distance-time response • Modal dispersion Optical reflection response tests • Port return loss • Distance-time response Microwave device characterization (electrical-in and electrical-out) Electrical transfer function tests • Insertion loss or gain • Output power flatness • Step response • Group delay and deviation from linear phase • Distance-time response Electrical reflection response tests • Port impedance or return loss • Distance-time
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